When you’re characterizing devices—not guessing—your RF interconnects must disappear into the measurement floor. ConductRF custom tailors lab-grade RF cable assemblies engineered for low loss, tight return loss/VSWR, phase and amplitude stability, excellent shielding, and repeatable connector performance. 
You’ll find our flexible, hand-formable, and semi-flexible solutions on everyday RF/microwave engineering test benches, our metrology-grade armored VNA cables on test stands making measurements up to 110 GHz, and our semi-rigid and ruggedized assemblies in a variety of production-level test environments.
Whether you’re qualifying power amplifier (PA) linearity, de-embedding a fixture, sweeping a phased-array front end, or running long duty cycles on a factory line, our assemblies are designed to deliver reliable, repeatable results.
Why Test & Measurement Engineers Choose ConductRF
- Frequency coverage up to 110 GHz with 1.0 mm, 1.85 mm, 2.4 mm, 2.92 mm, 3.5 mm, SMA, Type-N, and TNC connectors
 - Phase-stable, amplitude-stable constructions for vector error budgets and time-sensitive measurements
 - Ruggedized test options—armored, crush-resistant, and abrasion-resistant builds that withstand daily connect/disconnect and constant handling
 - Connector variety—precision interfaces, optional torque sleeves, and swept right-angle designs for tight racks without penalizing return loss
 - Boots and strain relief options—molded boots, heat-shrink sleeves, and reinforced strain-relief options to extend flex life, protect connectors under repeated bends, and ensure reliable performance
 - EMI protection—multi-shield and semi-rigid families for sensitive setups and low leakage
 - Lot-level assurance—100% lot testing for electrical performance before shipment
 - Made in the USA—Fully equipped facility in Methuen, MA USA and expert (IPC & J-STD) assemblers/technicians
 - Fast Delivery—Our quick-turn delivery commitment means shipments go out typically between 5–10 business days. Critical prototypes are often delivered faster.